ABEE: Your best partner in



Infrastructure Facilities


X- Ray Diffraction (XRD) for crystal structure determination, phase analyses and characterisation of battery components during cycling

X-ray photoelectron spectroscopy with Auger option (XPS-AES) for elements profiling

Atomic Force Microscope (AFM) integrated in a glovebox

Scanning Electron Microscope (SEM) for morphology analysis

Pilot line for Pouch Cell assembling upto 30 Ah

Cell testers and climate chambers from coin cells to battery pack level